Table 2 Outlines the methods of characterization employed in this investigation
Technique name | Instrument |
|---|---|
X-ray diffraction (XRD) | Philips diffractometer, model PW 2103/00 |
Fourier transform infrared (FTIR) | Nicolet spectrophotometer, model 6700 |
Transmission electron microscopy (TEM) | JEOL Model JSM-5400 LV |